The quality of embedded code is only as good as its test process. As such,
adopting a quality and reliability oriented design and testing approach is key
in the success of an embedded application development project.
BEACON Tester incorporates decades of embedded software testing experience into
an affordable development tool. Executing the software tests is a small portion
of the entire test process. Analysis of the software architecture for the purpose
of extracting test cases is an extremely time consuming and laborious task. Reducing
the amount of time developers need to spend analyzing and creating system tests,
increases the time available for new development.
BEACON Tester exhaustively examines the coverage of the software architecture
using the following methods:
Path-Related
Structured Path Coverage
Modified Condition / Decision Coverage
Decision (Branch) Coverage
Statement Coverage
Boundary Value Analysis (arithmetic comparisons)
Value-Related
Stressing
Input Range Stressing
Output Range Stressing
Table Data Access
Interface-Related
Stub Hierarchy Coverage
Inlined Hierarchy Coverage
In addition, BEACON Tester exhaustively analyzes the software architecture using
the following methods:
McCabe Complexity Cylcomatic
Metric
Standard
Modified
Predicate Equation
Production for Control Paths Control
Path Enumeration Data
Item Listing with Usage Information Vertical
Output Coupling Analysis Supremum
Range Analysis Supremum
Scaling Analysis
BEACON Tester provides results that allow developers to perform comprehensive
embedded system testing. BEACON Tester results include the following:
Input vectors for each
unit test case Expected output vector
for each test case Coverage summary report Clean identification of
the required and achieved coverage Unit level analysis and
documentation for selected analysis types BEACON
The Tester reduces the time for system development by reducing the time spent
during the formal test process. In addition, it applies expert test theory to
ensure maximum reliability.
Path-Related
